CSP
Compact spectrophotometer CSP, based on acousto-optical tunable filter is designed to measure the relative diffuse reflectance spectra of flat nonluminescent surfaces of various materials ( paper, cardboard, plastic) , coatings , food samples in the near-infrared region of the optical spectrum. The instrument allows the positioning of the surface measured with the help of built-in color video camera output spectra measured on its own display, transmit data on the measured objects to a personal computer for later comparison , research and detailed analysis.
Technical characteristics of CSP:
Parameter | Value |
Spectral measurement range | In agreement with the customer |
Measuring range SKDO% | 10 - 100 |
The bandwidth of 0.5 at a wavelength of 1200 nanometers, nm, of not more than | From 1 nm (software selectable) |
Step measuring wavelength | From 1 nm (software selectable) |
Limit of acceptable absolute error measurements SKDO% | 7 |
Limit of acceptable error of the wavelength scale, nm | ±3 |
Measuring the aperture diameter, mm | 3,0 ± 0,4 |
Measurement geometry | 45º/0º with a ring radiation source |
Warm-up time of the device, min, max | 5 |
Time of the measurement, with no more | 10 |
Time of continuous operation, h, not less | 10 |
Power consumed by the device from the AC voltage at the rated voltage, V*A, no more | 18 |
Weight, kg, not more | 2 |
Dimensions, length × width × height, mm | 200 × 85 × 60 |
PC software to work with the CSP: